The 2018 Integrated Circuit Inspection and Testing Industry Technology Seminar was held in Nantong.
Release date:
2018-04-02
On March 31, the Integrated Circuit Testing Instruments and Equipment Industry Technology Innovation Alliance, under the guidance of the Integrated Circuit Industry Technology Innovation Strategic Alliance, hosted the event.
On March 31, the "2018 Integrated Circuit Testing and Measurement Technology Seminar," guided by the Integrated Circuit Industry Technology Innovation Strategic Alliance and organized by the Integrated Circuit Testing Instruments and Equipment Industry Technology Innovation Alliance, with co-organizers including Nantong Municipal Commission of Economy and Information Technology and Tongfu Microelectronics, was held in Nantong.
Ye Tianchun, Chairman of the Integrated Circuit Testing Instruments and Equipment Industry Technology Innovation Alliance and Director of the Institute of Microelectronics at the Chinese Academy of Sciences, along with Qiu Gang, Deputy Inspector of the Major Projects Office at the Ministry of Science and Technology and Deputy Director of the Implementation Management Office for Project 02, and Xu Xiaotian, former Executive Vice Chairman of the China Semiconductor Industry Association, attended the meeting as industry leaders and experts. Shi Lei, President of Tongfu Microelectronics, also delivered a speech at the event. Lu Weidong, Vice Mayor of the Municipal Government, and Jiang Caimao, Secretary-General of the Municipal Government, were present as well.
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Tongfu Microelectronics Co., Ltd.
Tongfu Microelectronics
Address: No. 288 Chongchuan Road, Nantong, Jiangsu, China
Postal code: 226004
